- List
- Wassenaar Arrangement – List of Dual-Use Goods and Technologies – WA-LIST (25) 1
- Corresponding EU entry
- 2B006
a. Computer controlled or "numerical controlled" Coordinate Measuring Machines (CMM), having a three dimensional (volumetric) maximum permissible error of length measurement (E_(0,MPE)) at any point within the operating range of the machine (i.e., within the length of axes) equal to or less (better) than 1.7 + L/1,000 µm (L is the measured length in mm), according to ISO 10360-2:2009;
Technical Notes
For the purposes of 2.B.6.a.:
1. The E_(0,MPE) of the most accurate configuration of the CMM specified by the manufacturer (e.g., best of the following: probe, stylus length, motion parameters, environment) and with 'all compensations available' shall be compared to the 1.7 + L/1,000 µm threshold.
2. 'All compensations available' means after all feasible measures available to the manufacturer to minimise all systematic positioning errors for the particular machine-tool model or measuring errors or the particular CMM are considered.
b. Linear displacement measuring instruments or systems, linear position feedback units, and "electronic assemblies", as follows:
Note Interferometer and optical-encoder measuring systems containing a "laser" are only specified in 2.B.6.b.3.
1. 'Non-contact type measuring systems' with a 'resolution' equal to or less (better) than 0.2 µm within 0 to 0.2 mm of the 'measuring range';
Technical Notes
For the purposes of 2.B.6.b.1.:
1. 'Non-contact type measuring systems' are designed to measure the distance between the probe and measured object along a single vector, where the probe or measured object is in motion.
2. 'Measuring range' means the distance between the minimum and maximum working distance.
b. 2. Linear position feedback units specially designed for machine tools and having an overall "accuracy" less (better) than (800 + (600 x L/1,000)) nm (L equals effective length in mm);
3. Measuring systems having all of the following:
a. Containing a "laser";
b. A 'resolution' over their full scale of 0.200 nm or less (better); and
c. Capable of achieving a 'measurement uncertainty' equal to or less (better) than (1.6 + L/2,000) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20±0.01ºC;
Technical Notes
1. For the purposes of 2.B.6.b., 'resolution' is the least increment of a measuring device; on digital instruments, the least significant bit.
2. For the purposes of 2.B.6.b.3.c., 'measurement uncertainty' is the characteristic parameter which specifies in what range around the output value the correct value of the measurable variable lies with a confidence level of 95%. It includes the uncorrected systematic deviations, the uncorrected backlash and the random deviations (ISO 10360-2).
b. 4. "Electronic assemblies" specially designed to provide feedback capability in systems specified in 2.B.6.b.3.;
c. Rotary position feedback units specially designed for machine tools or angular displacement measuring instruments, having an angular position "accuracy" equal to or less (better) than 0.9 second of arc;
Note 2.B.6.c. does not apply to optical instruments, such as autocollimators, using collimated light (e.g., laser light) to detect angular displacement of a mirror.
d. Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0.5 nm or less (better).
Note 2.B.6. includes machine tools, other than those specified in 2.B.1., that can be used as measuring machines if they meet or exceed the criteria specified for the measuring machine function.
Technical Notes
For the purposes of 2.B.6.a.:
1. The E_(0,MPE) of the most accurate configuration of the CMM specified by the manufacturer (e.g., best of the following: probe, stylus length, motion parameters, environment) and with 'all compensations available' shall be compared to the 1.7 + L/1,000 µm threshold.
2. 'All compensations available' means after all feasible measures available to the manufacturer to minimise all systematic positioning errors for the particular machine-tool model or measuring errors or the particular CMM are considered.
b. Linear displacement measuring instruments or systems, linear position feedback units, and "electronic assemblies", as follows:
Note Interferometer and optical-encoder measuring systems containing a "laser" are only specified in 2.B.6.b.3.
1. 'Non-contact type measuring systems' with a 'resolution' equal to or less (better) than 0.2 µm within 0 to 0.2 mm of the 'measuring range';
Technical Notes
For the purposes of 2.B.6.b.1.:
1. 'Non-contact type measuring systems' are designed to measure the distance between the probe and measured object along a single vector, where the probe or measured object is in motion.
2. 'Measuring range' means the distance between the minimum and maximum working distance.
b. 2. Linear position feedback units specially designed for machine tools and having an overall "accuracy" less (better) than (800 + (600 x L/1,000)) nm (L equals effective length in mm);
3. Measuring systems having all of the following:
a. Containing a "laser";
b. A 'resolution' over their full scale of 0.200 nm or less (better); and
c. Capable of achieving a 'measurement uncertainty' equal to or less (better) than (1.6 + L/2,000) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20±0.01ºC;
Technical Notes
1. For the purposes of 2.B.6.b., 'resolution' is the least increment of a measuring device; on digital instruments, the least significant bit.
2. For the purposes of 2.B.6.b.3.c., 'measurement uncertainty' is the characteristic parameter which specifies in what range around the output value the correct value of the measurable variable lies with a confidence level of 95%. It includes the uncorrected systematic deviations, the uncorrected backlash and the random deviations (ISO 10360-2).
b. 4. "Electronic assemblies" specially designed to provide feedback capability in systems specified in 2.B.6.b.3.;
c. Rotary position feedback units specially designed for machine tools or angular displacement measuring instruments, having an angular position "accuracy" equal to or less (better) than 0.9 second of arc;
Note 2.B.6.c. does not apply to optical instruments, such as autocollimators, using collimated light (e.g., laser light) to detect angular displacement of a mirror.
d. Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0.5 nm or less (better).
Note 2.B.6. includes machine tools, other than those specified in 2.B.1., that can be used as measuring machines if they meet or exceed the criteria specified for the measuring machine function.